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1

Combined ToF-SIMS and AFM protocol for accurate 3D chemical analysis and data visualization

Moreno, Maiglid A., Mouton, Isabelle, Chevalier, Nicolas, Barnes, Jean-Paul, Bassani, Franck, Gautier, Brice

Journal:

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures

Year:

2018

Language:

english

File:

PDF, 5.00 MB

english, 2018

2

Morphology Transition of ZnO from Thin Film to Nanowires on Silicon and its Correlated Enhanced Zinc Polarity Uniformity and Piezoelectric Responses

Bui, Quang Chieu, Ardila, Gustavo, Sarigiannidou, Eirini, Roussel, HervÃ©, JimÃ©nez, Carmen, Chaix-Pluchery, Odette, Guerfi, Youssouf, Bassani, Franck, Donatini, Fabrice, Mescot, Xavier, Salem, Bassem

Journal:

ACS Applied Materials & Interfaces

Year:

2020

File:

PDF, 43.27 MB

2020

3

Negatively charged excitons and the optical properties of modulation-doped quantum wells

K. Kheng, R.T. Cox, V.P. Kochereshko, K. Saminadayar, S. Tatarenko, Franck Bassani, A. Franciosi

Journal:

Superlattices and Microstructures

Year:

1994

File:

PDF, 348 KB

1994

4

Recombination mechanisms in photopumped Zn1−xCdxSe/ZnSe multiple quantum well lasers

L. Calcagnile, M. Di Dio, , M. Lomascolo, R. Rinaldi, P. Prete, R. Cingolani, L. Vanzetti, A. Bonanni, Franck Bassani, , L. Sorba, , A. Franciosi,

Journal:

Journal of Crystal Growth

Year:

1995

Language:

english

File:

PDF, 551 KB

english, 1995

5

The electronic energy levels of Si-based nanocrystalline materials: theory compared with experiment

Louis Vervoort, Andrés Saúl, Franck Bassani, François Arnaud d'Avitaya

Journal:

Thin Solid Films

Year:

1997

Language:

english

File:

PDF, 387 KB

english, 1997

6

Memory properties and charge effect study in Si nanocrystals by scanning capacitance microscopy and spectroscopy

Zhen Lin, Georges Bremond, Franck Bassani

Journal:

Nanoscale Research Letters

Year:

2011

Language:

english

File:

PDF, 1.99 MB

english, 2011

7

in semiconductor quantum wells

Kheng, K., Cox, R. T., d’ Aubigné, Merle Y., Bassani, Franck, Saminadayar, K., Tatarenko, S.

Journal:

Physical Review Letters

Year:

1993

Language:

english

File:

PDF, 211 KB

english, 1993

8

Control of the interfacial abruptness of Au-catalyzed Si-Si1−xGex heterostructured nanowires grown by vapor–liquid–solid

Periwal, Priyanka, Baron, Thierry, Latu-Romain, Laurence, Salem, Bassem, Bassani, Franck, Patriarche, Gilles, Gentile, Pascal

Journal:

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films

Year:

2014

Language:

english

File:

PDF, 1.28 MB

english, 2014

9

Composition-Dependent Interfacial Abruptness in Au-Catalyzed Si 1– x Ge x /Si/Si 1– x Ge x Nanowire Heterostructures

Periwal, Priyanka, Sibirev, Nickolay V., Patriarche, Gilles, Salem, Bassem, Bassani, Franck, Dubrovskii, Vladimir G., Baron, Thierry

Journal:

Year:

2014

Language:

english

File:

PDF, 5.51 MB

english, 2014

10

High density and taper-free boron doped Si1−xGex nanowire via two-step growth process

Periwal, Priyanka, Salem, Bassem, Bassani, Franck, Baron, Thierry, Barnes, Jean-Paul

Journal:

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films

Year:

2014

Language:

english

File:

PDF, 2.21 MB

english, 2014

11

Dopant profiling in silicon nanowires measured by scanning capacitance microscopy

Bassani, Franck, Periwal, Priyanka, Salem, Bassem, Chevalier, Nicolas, Mariolle, Denis, Audoit, Guillaume, Gentile, Pascal, Baron, Thierry

Journal:

physica status solidi (RRL) - Rapid Research Letters

Year:

2014

Language:

english

File:

PDF, 397 KB

english, 2014

12

The Quantitative Study of Trapped Charges in Nano-Scale Ge Islands probed by EFM Measurement

Lin, Zhen, Brunkov, Pavel, Bassani, Franck, Bremond, Georges

Journal:

MRS Proceedings

Year:

2010

Language:

english

File:

PDF, 353 KB

english, 2010

13

EFM Study on Ge Island: Carrier Charge and Storage Effect

Lin, Zhen, Brunkov, Pavel, Ma, Xueying, Bassani, Franck, Bremond, Georges

Journal:

MRS Proceedings

Year:

2010

Language:

english

File:

PDF, 896 KB

english, 2010

14

SIMS depth profiling and topography studies of repetitive III–V trenches under low energy oxygen ion beam sputtering

Gorbenko, Viktoriia, Bassani, Franck, Merkulov, Alexandre, Baron, Thierry, Martin, Mickael, David, Sylvain, Barnes, Jean-Paul

Journal:

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures

Year:

2016

Language:

english

File:

PDF, 843 KB

english, 2016

15

Sub-10 nm plasma nanopatterning of InGaAs with nearly vertical and smooth sidewalls for advanced n-fin field effect transistors on silicon

Chouchane, Fares, Salem, Bassem, Gay, Guillaume, Martin, Mickael, Pargon, Erwine, Bassani, Franck, Arnaud, Sandrine, David, Sylvain, Alcotte, Reynald, Labau, Sébastien, Moeyart, Jérémy, Baron, Thierry

Journal:

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures

Year:

2017

Language:

english

File:

PDF, 1.29 MB

english, 2017

16

Low temperature growth and physical properties of InAs thin films grown on Si, GaAs and In 0.53 Ga 0.47 As template

Alcotte, Reynald, Martin, Mickael, Moeyaert, Jeremy, Gergaud, Patrice, David, Sylvain, Cerba, Tiphaine, Bassani, Franck, Ducroquet, Frederique, Bogumilowicz, Yann, Baron, Thierry

Journal:

Thin Solid Films

Year:

2017

Language:

english

File:

PDF, 959 KB

english, 2017

17

Direct measurement of AC electrokinetics properties and capture frequencies of Silicon and Silicon-Germanium nanowires

Merhej, Mouawad, Honegger, Thibault, BASSANI, Franck, Baron, Thierry, Peyrade, David, Drouin, Dominique, SALEM, Bassem

Journal:

Semiconductor Science and Technology

Year:

2017

Language:

english

File:

PDF, 2.70 MB

english, 2017

18

Growth of Ge 1− x Sn x Nanowires by Chemical Vapor Deposition via Vapor-Liquid-Solid Mechanism Using GeH 4 and SnCl 4

Haffner, Thibault, Zeghouane, Mohammed, Bassani, Franck, Gentile, Pascal, Gassenq, Alban, Chouchane, Fares, Pauc, Nicolas, Martinez, Eugenie, Robin, Eric, David, Sylvain, Baron, Thierry, Salem, Bassem

Journal:

physica status solidi (a)

Year:

2017

Language:

english

File:

PDF, 1.13 MB

english, 2017

19

Suppression of self-organized surface nanopatterning on GaSb/InAs multilayers induced by low energy oxygen ion bombardment by using simultaneously sample rotation and oxygen flooding

Beainy, Georges, Cerba, Tiphaine, Bassani, Franck, Martin, Mickaël, Baron, Thierry, Barnes, Jean-Paul

Journal:

Applied Surface Science

Year:

2018

Language:

english

File:

PDF, 1.38 MB

english, 2018

20

Direct examination of Si atoms spatial distribution and clustering in GaAs thin films with atom probe tomography

Beainy, Georges, Alcotte, Reynald, Bassani, Franck, Martin, Mickaël, Grenier, Adeline, Baron, Thierry, Barnes, Jean-Paul

Journal:

Scripta Materialia

Year:

2018

Language:

english

File:

PDF, 1.89 MB

english, 2018

21

Impact of wet treatments on the electrical performance of Ge0.9Sn0.1 based p-MOS capacitors

Mahjoub, Mohamed Aymen, HAFFNER, Thibault, labau, sebastien, eustache, etienne, aubin, joris, Hartmann, Jean-Michel, Ghibaudo, Gerard, Pelissier, Bernard, Bassani, Franck, Salem, Bassem

Journal:

ACS Applied Electronic Materials

Year:

2019

Language:

english

File:

PDF, 546 KB

english, 2019

22

Formation mechanisms of ZnO nanowires on polycrystalline Au seed layers for piezoelectric applications

Lausecker, Clément, SALEM, Bassem, Baillin, Xavier, Roussel, Hervé, Sarigiannidou, Eirini, BASSANI, Franck, Appert, Estelle, Labau, Sébastien, Consonni, Vincent

Journal:

Year:

2019

File:

PDF, 2.21 MB

2019

23

Epitaxial Growth of High‐Quality AlGaInAs‐based Active Structures on a Directly‐Bonded InP‐SiO 2 /Si Substrate

Besançon, Claire, Vaissiere, Nicolas, Dupré, Cécilia, Fournel, Frank, Sanchez, Loic, Jany, Christophe, David, Sylvain, Bassani, Franck, Baron, Thierry, Decobert, Jean

Journal:

physica status solidi (a)

Year:

2019

Language:

english

File:

PDF, 521 KB

english, 2019

24

Epitaxial Growth of High‐Quality AlGaInAs‐based Active Structures on a Directly‐Bonded InP‐SiO 2 /Si Substrate

Besançon, Claire, Vaissiere, Nicolas, Dupré, Cécilia, Fournel, Frank, Sanchez, Loic, Jany, Christophe, David, Sylvain, Bassani, Franck, Baron, Thierry, Decobert, Jean

Journal:

physica status solidi (a)

Year:

2019

File:

PDF, 521 KB

2019

25

Comparison of AlGaInAs-Based Laser Behavior Grown on Hybrid InP-SiOâ/Si and InP Substrates

Besancon, Claire, David, Sylvain, Baron, Thierry, Decobert, Jean, Cerulo, Giancarlo, Neel, Delphine, Vaissiere, Nicolas, Make, Dalila, Fournel, Frank, Dupre, Cecilia, Jany, Christophe, Bassani, Franck

Journal:

IEEE Photonics Technology Letters

Year:

2020

Language:

english

File:

PDF, 2.47 MB

english, 2020

26

[IEEE 2019 Compound Semiconductor Week (CSW) - Nara, Japan (2019.5.19-2019.5.23)] 2019 Compound Semiconductor Week (CSW) - High-quality Epitaxial Growth of AlGaInAs-based Active Structure on a Directly-Bonded InPoSi Substrate

Besancon, Claire, Decobert, Jean, Le Goec, Jean-Pierre, Vaissiere, Nicolas, Dupre, Cecilia, Muffato, Viviane, Fournel, Frank, Jany, Christophe, Bassani, Franck, David, Sylvain, Baron, Thierry

Year:

2019

File:

PDF, 4.59 MB

2019

27

Impact of the droplet composition on the nucleation rate and morphology of vapor-liquid-solid GeSn nanowires

Hijazi, Hadi, Zeghouane, Mohammed, BASSANI, Franck, Gentile, Pascal, SALEM, Bassem, Dubrovskii, Vladimir G

Journal:

Year:

2020

File:

PDF, 650 KB

2020

28

Transcriptomic and Ultrastructural Signatures of K+-Induced Aggregation in Phytophthora parasitica Zoospores

Bassani, Ilaria, Rancurel, Corinne, Pagnotta, Sophie, Orange, FranÃ§ois, Pons, Nicolas, Lebrigand, Kevin, PanabiÃ¨res, Franck, Counillon, Laurent, Noblin, Xavier, Galiana, Eric

Journal:

Year:

2020

File:

PDF, 1.73 MB

2020

29

Improvement of AlN film quality using plasma enhanced atomic layer deposition with substrate biasing

Legallais, Maxime, Mehdi, Hussein, David, Sylvain, Bassani, Franck, Labau, SÃ©bastien, Pelissier, Bernard, Baron, Thierry, Martinez, Eugenie, Ghibaudo, GÃ©rard, Salem, Bassem

Journal:

ACS Applied Materials & Interfaces

Year:

2020

File:

PDF, 2.79 MB

2020

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